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Physical Aspects of Electron Microscopy and Microbeam Analysis

By: Material type: TextTextPublication details: JOHN WILEY NEW YORK 1975Subject(s): DDC classification:
  • 535.3325 SIE-P
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
BOOK SB LIBRARY GENERAL STACK 535.3325 SIE-P (Browse shelf(Opens below)) Available 00048910
Total holds: 0

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