Siegel, Benjamin M <br/><br/>
Physical Aspects of Electron Microscopy and Microbeam Analysis 

 - NEW YORK  JOHN WILEY  1975 
<br/><br/><label>Subjects--Uniform Titles: </label>--GENERAL STACK
<br/><br/><label>Subjects--Topical Terms: </label><br/>Natural sciences & mathematics--Light & infrared & ultraviolet phenomenaZoology--Physics
<br/><br/><label>Dewey Class. No.: </label>535.3325  / SIE-P