TY  - BOOK
AU  - Siegel, Benjamin M
TI  - Physical Aspects of Electron Microscopy and Microbeam Analysis
U1  - 535.3325 
PY  - 1975///
CY  - NEW YORK
PB  - JOHN WILEY
KW  - GENERAL STACK
KW  - Natural sciences & mathematics
KW  - Physics
KW  - Light & infrared & ultraviolet phenomenaZoology
ER  -